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Second ITWS - European IS-Test Workshop 2008
The nightmare continues:
"Dirty Talk" about Probe Card Cleaning
May 26-27, 2008
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Learn more about wafer sort, test engineering
and backend test technologies from
IEEE SW Test Workshop, San Diego, CA
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The program committee in alphabetical order:
- Dr. Jerry Broz
- Mr. Ger Koch
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The 1st Europeean IS-Test Workshop 2007 about Temperature Probing was very successful.
Major semiconductor- and equipment-manufacturers came from all over Europe and the USA.
We are happy to invite you to the 2nd European IS-Test-Workshop 2008 featuring
Probe Card Cleaning Strategies.
The workshop is manufacturer-independent, solely technical oriented - no sales presentations.
It provides plenty of time for discussions during and between the sessions.
The dinner is followed by more Offline discussions and exchange of ideas on the bar or in the lobby of the hotel.
Please send us an  to
or call +49(0)89-810 99 406.
We are happy to assist you in any question.
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E-Mail: 
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Please use our [contact form] for further information
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